Le9551
Single Channel Ringing SLIC (-100 V or -145 V)
Overview
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The Le9551 Single Ringing SLIC device is optimized for single channel designs to provide battery feed, ringing, and supervision on voice loops found in short-loop VoIP applications. This device utilizes a serial bus to interface to the Broadcom BCM3383/84/85/90 cable SoCs and BCM6818/28/38 PON SoCs. The Le9551 device operates independently from a single, user-adjusted battery and a +3.3 V VCC providing forward and reverse battery feed, voice transmission, power ringing, an ultra low-power scan state, ground start (Tip open), and a disconnect state. A test load switch is also included to support integrated test algorithms. |
Features & Benefits
- Single Channel High Voltage Ringing SLIC
- Optimized 4x5mm 28-pin QFN package for single channel designs
- Functionally Equivalent of Le9540 One Channel
- Operation Control and Status Report through Serial Interface with Reset
- SLIC Operation State / DC Current Limit / Test Load Enable
- DC Loop Closure / Ring Trip / Thermal Shutdown
- High Voltage Design
- Meets Comcast Ringing requirements without clipping distortion
- Robust solution with no damage during extended ringing cycles or switching the ringer on and off
- Allows use of 50 Ω protection resistors and lower cost lower current rated protectors
- Two Grades
- Up to -145 V ringing battery Le9551D
- Up to -100 V ringing battery Le9551C
- Eight Operating States
- Scan state for minimal power dissipation
- Active Forward Battery (Default Power Up State)
- Active Forward Battery ICV
- Active Reverse Battery
- Tip Open Ground Start
- Wink
- Ringing
- Disconnect (Default Power Up Mode)
- Ringing Inputs for Optimized Interface to BCM SoC Devices
- Allows to accept driving signals from voice outputs as well as from PWM outputs
- Ultra-Low On-Hook Power
- Loop Start, Ring Trip, and Ground Start Detections
- Loop closure detection with hysteresis to minimize dial pulse distortion
- Thermal Shutdown Protection with Hysteresis
- Test Load Switch
- Supports integrated test algorithms