Le9540
Dual Channel Ringing SLIC (-100 V or -145 V)
Overview
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The Le9540 Dual Ringing SLIC device is a dual-channel device optimized to provide battery feed, ringing, and supervision on voice loops found in short-loop VoIP applications. This device is optimized with a serial bus to interface to the Broadcom BCM3383/84/85/90 cable SoCs and BCM6818/28/38 PON SoCs. The Le9540 device operates independently from a single, user-adjusted battery and a +3.3 V VCC per channel. Each channel provides forward and reverse battery feed, voice transmission, power ringing, an ultra low-power scan state, ground start (Tip open), and a disconnect state. A test load switch is also included to support integrated test algorithms. |
Features & Benefits
- Dual Architecture
- Two fully independent integrated SLIC channel
- No impulse noise crosstalk in any operation states to the listening channel in forward or reverse active states
- Two Power Supplies
- Single user adjusted battery input per channel
- 3.3 V for VCC
- High Voltage Design
- Meets Comcast Ringing requirements without clipping distortion
- Robust solution with no damage during extended ringing cycles or switching the ringer on and off
- Allows use of 50 Ω protection resistors and lower cost lower current rated protectors
- Two Grades
- Up to -145 V ringing battery Le9540D
- Up to -100 V ringing battery Le9540C
- Channel Independent Eight Operating States
- Scan state for minimal power dissipation
- Active Forward Battery (Default Power Up State)
- Active Forward Battery ICV
- Active Reverse Battery
- Tip Open Ground Start
- Wink
- Ringing
- Disconnect (Default Power Up Mode)
- Per Channel Ringing Inputs for Optimized Interface to BCM SoC Devices
- Allows to accept driving signals from per channel voice outputs as well as from PWM outputs
- Ultra-Low On-Hook Power
- Loop Start, Ring Trip, and Ground Start Detections
- Loop closure detection with hysteresis to minimize dial pulse distortion
- Thermal Shutdown Protection with Hysteresis
- Test Load Switch
- Supports integrated test algorithms