53100A
Next Generation Phase Noise Analyzer
Overview
Rapid, Multi-function, Precision Oscillator Characterization
![](/images/products/200326-CORP-PHOTO-53100a-Demo.png)
![](/images/ftd/200326-CORP-PHOTO-53100a-Demo.png)
Expanding upon the heritage of the 3120A and 51XXA series of instruments, the 53100A makes fast yet accurate single side band (SSB) phase noise and Allan deviation (ADEV) measurements at a fraction of the cost of alternate solutions. Thanks to an improved design and advancements in manufacturing, the 53100A offers improvements in reliability and performance over its predecessor technologies.
Key Features
- Allan deviation (ADEV) typically less than 5E-15 at t=1s, 1E-16 at t=1000s
- Modified Allan deviation (MDEV), Hadamard deviation (HDEV), and time deviation (TDEV)
- RMS-integrated time jitter, residual FM, and SSB carrier/noise ratio
- Phase noise and AM noise at offsets from 0.001 Hz to 1 MHz and levels below typically below -175 dBc/Hz (10 MHz floor)
- Independent input and reference frequencies from 1 to 200 MHz
- No phase-locking or measurement calibration required
- Single or dual reference oscillator inputs allow cross-correlation measurements
- TSC 51XXA command and data stream emulation reduces the burden of re-writing existing test scripts
- Intuitive Graphical User Interface for easy set-up and monitoring
- Measurements beyond 200MHz, with external down-conversion
Precise Oscillator Characterization with Phase Noise Analyzer from Microchip Technology Inc. on Vimeo.
Resources
Data Sheet
App Notes & White Papers
- Rapid, Precision Phase Noise Measurements Without Calibration (AN3502)
- NEW! Reduce Phase Noise Measurement Floor with Dual References (AN3562)
- NEW! Extend the Frequency Range of the 53100A to Measure Microwave Oscillators (AN3899)