Test & Measurement
Microsemi’s digital, state-of-the-art test sets bring a paradigm shift to the way that phase noise and ADEV measurements are made. What was once a complicated and costly procedure has now been made easier, more accurate, and more cost effective. Typically used to characterize high precision oscillators and atomic clocks, Microsemi’s test sets are simple one-box solutions that characterize even the lowest noise references more accurately than ever before.
Phase Noise and Allen Deviation Test Sets
Phase Noise and Allen Deviation Test Probes
Test probes make accurate phase-noise and ADEV measurements of the most commonly used frequency references. They require an external reference and computer along with Test Software to make these measurements.