RTG4 Radiation-Tolerant FPGAs
High-Speed RT FPGAs for Signal Processing Applications
Overview
RTG4 FPGAs integrate Microsemi’s fourth-generation flash-based FPGA fabric and high-performance interfaces such as serialization/deserialization (SERDES) on a single chip while maintaining the resistance to radiation-induced configuration upsets in the harshest radiation environments, such as space flight (LEO, MEO, GEO, HEO, deep space); high altitude aviation, medical electronics, and nuclear power plant control.
Radiation Performance

RTG4 FPGAs are immune to radiation-induced changes in configuration, due to the robustness of the flash cells used to connect and configure logic resources and routing tracks. No background scrubbing or reconfiguration of the FPGA is needed in order to mitigate changes in configuration due to radiation effects. Data errors, due to radiation, are mitigated by hardwired SEU resistant flip-flops in the logic cells and in the mathblocks. Single Error Correct Double Error Detect (SECDED) protection is optional for the embedded SRAM (LSRAM and uSRAM) and the DDR memory controllers. This means that if a one-bit error is detected, it will be corrected. Errors of more than one bit are detected only and not corrected. SECDED error signals are brought to the FPGA fabric to allow the user to monitor the status of these protected internal memories.
Here is a summary of RTG4 FPGAs radiation performance:
- Configuration memory upsets immunity to LET > 103 MeV.cm2/mg
- Single-event latch-up (SEL) immunity to LET > 103 MeV.cm2/mg
- SEU-hardened registers eliminate the need for triple-module redundancy (TMR)
- Immune to single-event upsets (SEU) to LET > 37 MeV.cm2/mg
- SEU rate < 10–12 errors/bit-day (GEO Solar Min)
- SRAM has a built-in error detection and correction (EDAC)
- Upset rate < 10–11 errors/bit-day (GEO Solar Min)
- Single error correction and double error detection (SECDED)
- Single-event transient (SET) upset rate < 10–8 errors/bit-day (GEO Solar Min) with optional SET filter
- Total ionizing dose (TID) > 100 krad
Reliability and Qualification
RTG4 FPGAs are manufactured on a low power 65nm process with substantial reliability heritage. RTG4 CG/LG-1657 packages FPGAs are now qualified to QML Class V qualification. Our new RTG4 CQFP-352 FPGAs are now qualified to QML Class Q Qualification and currently seeking QML Class V Qualification. Refer to this reference guide for the equivalent Defense Logistics Agency (DLA) part number to Microsemi’s part number.
Documents
Product Brief
RTG4 FPGAs Technical Brief | ![]() |
689 kB | 11/2020 |
RTG4 ES Description | ![]() |
209 kB | 6/2015 |
RTG4 MS Description | ![]() |
209 kB | 8/2015 |
RT-PROTO FPGA Description | ![]() |
380 kB | 9/2017 |
Datasheet
RTG4 FPGA Datasheet | ![]() |
2.15 MB | 9/2020 |
DS0130: RTG4 FPGA Pin Descriptions Datasheet | ![]() |
292 kB | 2/2019 |
Product Notifications
RTG4 PLL Calculator
Note: use the same login credentials as those used to download Libero software.
RTG4 PLL Calculator Files Zip Folder | 20.93 MB | 7/2019 |
Characterization Reports
CR0028: RTG4 FPGA Characterization Report for XAUI |
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3 MB | 12/2019 |
CR0031: RTG4 PCIe Characterization Report | ![]() |
433 kB | 5/2017 |
TR0030: RTG4 FPGA CoreJESD204BRX Interoperability Test Report | ![]() |
1.69 MB | 4/2017 |
MR0014: SmartFusion2 SoC FPGAs, IGLOO2, and RTG4 SerDes Transmission Media Report | ![]() |
1.47 MB | 2/2018 |
Videos / Webinars
Introducing RTG4 FPGAs | 5 mins | 4/2015 |
RTG4 Architecture and Features | 4 mins | 4/2015 |
RTG4 Reliability and Radiation Effects | 5 mins | 4/2015 |
Solving Satellite Signal Processing Congestion Webinar | 1 hr | 4/2015 |
White Papers
Product Brochures
Radiation-Tolerant FPGAs | ![]() |
2.7 MB | 3/2020 |
Space Solutions Brochure | ![]() |
3.5 MB | 10/2019 |
Packaging
AC190: Ceramic Column Grid Array Application Note | ![]() |
1.97 MB | 6/2019 |
CG1657 Package Outline Drawing | ![]() |
180 kB | 8/2016 |
CB1657 Package Outline Drawing |
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2.1 MB | 4/2015 |
CG1657 Package Pin Assignment Table |
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163 kB | 7/2016 |
UG0666: CG1657 Daisy Chain Package User Guide | ![]() |
895 kB | 11/2015 |
CG1657 Daisy Chain Package Pin Connections | ![]() |
17 kB | 11/2015 |
CQ352 Package Outline Drawing | ![]() |
172 kB | 1/2017 |
CQ352 Package Pin Assignment Table |
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49 kB | 6/2018 |
SpaceWire Pin Mapping from RTG4 ES/MS Silicon to PROTO/Flight Silicon | ![]() |
18 kB | 4/2015 |
Plastic RT4G150-FCG1657M Package Outline Drawing | ![]() |
77 KB | 2/2020 |
FC1657 and FCG1657 Package Pin Assignment Table | ![]() |
15.04 KB | 4/2020 |
FCG1657 Daisy Chain Package | ![]() |
292 KB | 6/2020 |
Radiation & Reliability Data
Total Ionizing Dose (TID) Reports
Please visit our Radiation & Reliability page to view all TID reports.Single Event Effects (SEE) Reports
Please visit our Radiation & Reliability page to view all SEE reports.
Silicon User Guides
UG0573: RTG4 FPGA DDR Memory Controller User Guide | ![]() |
3.38 MB | 05/2019 |
UG0574: RTG4 FPGA Fabric User Guide | ![]() |
3.42 MB | 08/2019 |
UG0586: RTG4 FPGA Clocking Resources User Guide | ![]() |
3.20 MB | 04/2020 |
UG0567: RTG4 FPGA High-Speed Serial Interfaces User Guide | ![]() |
4.47 MB | 05/2020 |
UG0602: RTG4 FPGA Programming User Guide | ![]() |
0.83 MB | 05/2019 |
UG0576: RTG4 FPGA System Controller User Guide | ![]() |
507 kB | 10/2018 |
UG0741: RTG4 FPGA I/O User Guide | ![]() |
907.74 kB | 02/2020 |
Application Notes
Software Tools
Configuration Guides
Demo Guides & Labs
Power Analysis
For all Power Estimators please visit our Power Calculators Page.
Errata
ER0193: RTG4 FPGA Errata | ![]() |
328 KB | 4/2019 |
Design Resources
Space System Managers are companion devices that can be used with any Radiation-Tolerant FPGAs

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Prototyping Solutions |
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Product Selector Guide
RTG4 FPGAs integrate Microsemi’s fourth-generation flash-based FPGA fabric high-performance serialization/deserialization (SERDES) transceivers on a single chip while maintaining resistance to radiation-induced configuration upsets in the harshest radiation environments, such as space flight (LEO, MEO, GEO, HEO, and deep space), high altitude aviation, medical electronics, and nuclear power plant control.
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