Radiation & Reliability Data
Overview
- Single Event Upset (SEU) and Single Event Latch-Up (SEL) Performance
- Total Ionizing Dose (TID) Performance
- Neutron-Induced Firm Errors
- General High Reliability Product Information
Single Event Upset (SEU) and Single Event Latch-Up (SEL) Performance
Ionizing radiation can cause unwanted effects in semiconductor devices. Energetic protons, neutrons, heavy ions, and alpha particles can strike sensitive regions of the transistor, causing various failures, or Single Event Effects (SEE), such as:
Single Event Upsets (SEUs), which occur when high-energy ionizing particles, such as heavy ions, alpha particles or protons, irradiate a circuit or pass through an integrated circuit causing a disruption in the system logic.
Single Event Latch-Up (SEL), which is a condition that causes loss of device functionality due to a single-event-induced high current state. A SEL may or may not cause permanent device damage, but requires power strobing of the device to resume normal device operations. Devices with low (< 37.5 MeV-cm2/mg) SEL LETth are considered unsuitable for space applications.
- RTG4 SEE Reports
- RTAX-S/SL/DSP SEE Reports
- RT ProASIC3 SEE Reports
- RTSX-S/SU SEE Reports
- RT Legacy SEE Reports
Total Ionizing Dose (TID)
Total Ionizing Dose (TID) is caused by radiation due to charged particles and gamma rays in Space. This radiation deposits energy by causing ionization in the material. The ionization can change the charge excitation, charge transport, bonding, and decomposition properties of the material, and therefore, the device parameters. Total dose is the cumulative ionizing radiation that an electronic device receives over a specified period of time. The damage is dependant on the amount of radiation and how long it took to accumulate the total dose and is expressed in RAD (Radiation Absorbed Dose). Microsemi performs wafer lot specific TID testing per TM1019 of Mil-Std 883 class B. Test reports are posted here for customers' information. The results obtained do not constitute a guarantee that all units from each wafer lot will meet the TID levels observed in sample testing.
- RTG4 TID Reports
- RTAX-S/SL/DSP TID Reports
- RT ProASIC3 TID Reports
- RTSX-S/SU TID Reports
- RT Legacy TID Reports
Neutron-Induced Firm Errors
General High Reliability Product Information
General Information
Microsemi Corporation COTS and Up-Screening Policy | ![]() |
66 KB | 1/2003 |
Post-Programming Burn-In on Microsemi FPGAs | ![]() |
471 KB | 1/2003 |
RadHard FAQ | ![]() |
103 KB | 3/1997 |
Quality & Reliability Reports
High Reliability White Papers
FPGA Reliability and the Sunspot Cycle White Paper | ![]() |
9/2011 | |
RTAX-S Testing and Reliability Update | ![]() |
82 KB | 9/2007 |
Enhanced Qualification and Lot Acceptance Procedures | ![]() |
35 KB | 8/2005 |
TID Reports
Total Ionizing Dose (TID)
RTG4 TID Reports
RTAX-S/SL/DSP TID Reports
RT ProASIC3 TID Reports
RT3PE3000L-CG896-QQW05 TID Report | ![]() |
2.18 MB | 9/2021 |
RT3PE3000L-CG484-QQW04 TID Report | ![]() |
4.98 MB | 7/2021 |
RT3PE3000L-CG484-QMPWN TID Report | ![]() |
1.32 MB | 3/2017 |
RT3PE3000L-CG896-QMLPK TID Report | ![]() |
1.45 MB | 12/2016 |
RT3PE3000L-CG484-QKN6Y TID Report | ![]() |
2 MB | 8/2015 |
RT3PE3000L-CG896-QHR8G TID Report | ![]() |
4 MB | 10/2011 |
RT3PE600L-CG484-QJA2H TID Report | ![]() |
4 MB | 4/2011 |
RT3PE3000L-CG484-QJA2G TID Report | ![]() |
6 MB | 2/2011 |
RTSX-S and RTSX-SU TID Reports
RT Legacy TID Reports
RT1460A-CQ196B-FP6128401 TID Report | ![]() |
1.5 MB | 3/2016 |
RTAX1000S-CQ352-D59RP1 TID Report | ![]() |
3 MB | 2/2013 |
RT1280-FP5986501 TID Report | ![]() |
4 MB | 8/2011 |
RT14100A-FP2732701 TID Report | ![]() |
762 KB | 8/2008 |
RT1280A-FP21573 TID Report | ![]() |
358 KB | 3/2008 |
RT14100A-UBCL011 TID Report | ![]() |
319 KB | 9/2007 |
RT1020-1980166 TID Report | ![]() |
289 KB | 11/2001 |
RT14100A-UCL086 TID Report | ![]() |
346 KB | 9/2001 |
RT1280A-U1H609 TID Report | ![]() |
376 KB | 6/2001 |
RT1280A-U1H611 TID Report | ![]() |
300 KB | 4/2001 |
RT14100-UCL082 TID Report | ![]() |
342 KB | 2/2001 |
RT1460-UCK069 TID Report | ![]() |
316 KB | 2/2016 |
RT1280A-U1H486 TID Report | ![]() |
280 KB | 3/2000 |
RT14100A-UCL073 TID Report | ![]() |
245 KB | 11/1999 |
RT14100A-UCL072 TID Report | ![]() |
340 KB | 10/1999 |
RT1020-159 Rev 0 TID Report | ![]() |
202 KB | 7/1999 |
RT1460A-UCK062 TID Report | ![]() |
59 KB | 11/1998 |
RT1425A-UCJ014X TID Report | ![]() |
57 KB | 9/1998 |
Note: TID reports are provided for information only and do not indicate availability of product from any specific wafer lot. Please contact your local Microsemi sales office for availability information on any specific wafer lot.
SEE Reports
Single Event Upset (SEU) and Single Event Latch-Up (SEL) Performance
The SEU and SEL performance of Microsemi products are included in the radiation reports below.
RTG4 SEE Reports
RTG4 Radiation Tolerant Features Summary | ![]() |
26.79 KB | 01/2021 |
RTG4 Proton DDR SERDES POR Programming UCD Report | ![]() |
298.46 KB | 12/2020 |
RTG4 SERDES Heavy Ion LBNL Report | ![]() |
289 KB | 10/2020 |
RTG4 PLL, POR and Inflight-Programming Heavy Ion SEE Report | ![]() |
680 KB | 05/2021 |
RTG4 - MSIO SEE Testing Report | ![]() |
94.8 KB | 08/2020 |
RTG4 Fabric DDR Controller Testing Report | ![]() |
208 KB | 01/2019 |
RTG4 Proton Test Report | ![]() |
803 KB | 5/2020 |
2017 Space Forum - RTG4 Radiation Update | ![]() |
1.27 MB | 5/2017 |
2016 RADECS - Single Event Effects Hardening on 65-nm Flash-based FPGA |
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890 KB | 9/2016 |
2016 HEART RTG4 Radiation Update | ![]() |
1.35 MB | 8/2016 |
2016 SEE/MAPLD - NASA's RTG4 Radiation Update | ![]() |
2.5 MB | 5/2016 |
TID and SEE Characterization of Microsemi’s 4th Generation Radiation Tolerant RTG4 Flash-Based FPGA | ![]() |
1.5 MB | 11/2015 |
A Novel 65 nm Radiation Tolerant Flash Configuration Cell Used in RTG4 Field Programmable Gate Array | ![]() |
1.3 MB | 11/2015 |
RTAX-S/SL/DSP SEE Reports
RTAX-S TAMU Single Event Dielectric Rupture | ![]() |
246 KB | 9/2006 |
RTAX-S SEE Report–Analysis of NASA/Goddard High Speed SET/SEU Data | ![]() |
138 KB | 8/2006 |
RTAXS TAMU Single Event Latch-up Test Report | ![]() |
178 KB | 8/2006 |
RTAX-S SEE Report | ![]() |
645 KB | 8/2004 |
RTAX-S SEE Data for the EDAC RAM | ![]() |
282 KB | 6/2004 |
SEE Characterization of the New RTAX-DSP (RTAX-D) Antifuse-Based FPGA Presented at NSREC 2010 |
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1.1 MB | 8/2010 |
SET Characterization and Mitigation in RTAX-S Antifuse FPGAs | ![]() |
668 KB | 6/2011 |
RT ProASIC3 SEE Reports
RTSX-S/SU SEE Reports
RTSX72SU SEE Report–Analysis of NASA/Goddard High Speed SET/SEU Data | ![]() |
97 KB | 3/2007 |
RTSX-SU SEE Heavy Ion Beam Test Report | ![]() |
47 KB | 6/2005 |
RT Legacy SEE Reports
Radiation Performance of Microsemi Products | ![]() |
95 KB | 4/2004 |
RT-SX .6µ Product Radiation Data Report | ![]() |
64 KB | 3/1999 |