Microsemi LX7720 in the Spotlight at RADECS

Our new LX7720 Power Driver with Rotation and Position Sensing was showcased at the recent Radiation Effects on Components and Systems (RADECS) conference held in Gothenburg, Sweden September 16 – 21, 2018. The aim of the RADECS conference is to provide an annual European forum for the presentation and discussion of the latest advances in the field of radiation effects on electronic devices, circuits, sensors, and systems.

The LX7720 is the second member of our mixed signal Space System Manager (SSM) family and is radiation hardened by design. A poster presentation was delivered at the Data Workshop session showing heavy ion SEL test results.These results conclude that the LX7720 design is SEL immune up to 87 MeV.cm2/mg and 125°C (fluence of 1E7 particles/cm2) for VMPS=36V. In addition, no SEFI was observed.

Overall, the LX7720 shows strong performance under the beam for the evaluated blocks including the hardened flip-flops and the upper and lower high voltage drivers. Additional testing was performed in October 2018 to collect additional data on non-evaluated blocks and at higher VMPS voltages. An updated report will be available in November.

Please contact dorian.johnson@microchip.com to obtain a copy of the test results.

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