Microsemi RTG4 FPGA Radiation Update

Radiation testing of the RTG4 RT FPGA family continues. We recently posted proton single event effect test results on the Microsemi web page, here.

Other tests which have been conducted include tests on single event effects in the PLL in heavy ions, reprogramming in heavy ions, reprogramming in neutrons, and power-up cycles in heavy ions. Formal reports on these tests are in the process of being written and are not yet available, however an overview of the results can be obtained on request from Microsemi.

Email your requests to ken.o’neill@microchip.com, minh.nguyen@microchip.com, or julian.dimatteo@microchip.com.

Additional tests are planned in the coming months. RTG4 FPGA features which will be tested include PLL, SERDES, and DDR controller.

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