This year’s Nuclear and Space Radiation Effects Conference (NSREC) took place in New Orleans on July 17–21. Engineers and scientists from Microsemi presented two papers describing new test results on two of Microsemi’s latest radiation-tolerant products… —the LX7730, the first radiation-hardened fully integrated telemetry controller; and the RTG4 radiation tolerant FPGAs.
The results presented on the LX7730 Spacecraft Telemetry Manager included Total Ionizing Dose (TID) testing, Enhanced Low Dose Rate Sensitivity (ELDRS) testing, and heavy-ion Single Event Effects testing. The TID performance at 100 krad and ELDRS performance at 50 krad of the different blocks of this highly integrated device is consistent with the pre-radiation results. The design is single-event latch-up (SEL) immune up to 87 MeV.cm2 /mg and 125 °C (fluence of 1e8 particles/cm2 ). In addition, the LX7730 shows strong performance under the beam up to 83 MeV.cm2 /mg of all evaluated blocks including the internally regulated currents and voltages as well as the complete telemetry chain.
The RTG4 FPGAs were subjected to a study of the combined effects of dynamic high-temperature burn-in and total dose exposure. In the test, RTG4 FPGAs were operated at junction temperatures in excess of 125 °C for 3,000 hours, followed by a 100 krad TID test. The testing demonstrated that long-term high-temperature
operation had minimal effect on the ability of the RTG4 FPGAs to withstand 100 krad total dose exposure.
For a copy of the LX7730 paper, please contact firstname.lastname@example.org
For a copy of the RTG4 paper, please contact email@example.com
Next year’s conference will be at the Hilton Waikoloa Village in Hawaii, July 16–20, 2018.
We look forward to seeing all our customers there!
Please contact me at any time with comments or questions (Ken.O’Neill@Microsemi.com). Connect with me on LinkedIn, too.
Leave a Reply
You must be logged in to post a comment.