SEE Symposium and MAPLD

Microsemi participated in the Single Event Effects (SEE) Symposium and the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop in San Diego, California, on May 22-25, 2017….

We presented the following papers: “Neutron and Heavy Ion SEE testing of Microsemi SmartFusion2 FPGA” presented by Nadia Rezzak, “Single Event Induced VT Shift in Flash Cells of Flash-Based FPGA” presented by J. J. Wang, and “Single Event Effects Hardening and Testing on Mixed Signal Telemetry LX7730 Controller” presented by Kathy Zhang.

Copies of the conference papers may be obtained from the Microsemi Space Marketing team:

Ken O’Neill – ken.oneill@microsemi.com

Minh U. Nguyen – minh.u.nguyen@microsemi.com

Dorian Johnson – dorian.johnson@microsemi.com

Tags: , , , , , ,

This entry was posted by Ken O'Neill on at and is filed under Space. You can follow any responses to this entry through the RSS 2.0 feed. You can leave a response, or trackback from your own site.

Leave a Reply

You must be logged in to post a comment.