Microsemi participated in the Single Event Effects (SEE) Symposium and the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop in San Diego, California, on May 22-25, 2017….
We presented the following papers: “Neutron and Heavy Ion SEE testing of Microsemi SmartFusion2 FPGA” presented by Nadia Rezzak, “Single Event Induced VT Shift in Flash Cells of Flash-Based FPGA” presented by J. J. Wang, and “Single Event Effects Hardening and Testing on Mixed Signal Telemetry LX7730 Controller” presented by Kathy Zhang.
Copies of the conference papers may be obtained from the Microsemi Space Marketing team:
Ken O’Neill – email@example.com
Minh U. Nguyen – firstname.lastname@example.org
Dorian Johnson – email@example.com
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